An Introduction to Electron Microscopy Imaging Analysis Techniques
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An Introduction to Electron Microscopy Imaging Analysis Techniques
The third of the Advanced Materials Characterisation Webinar Series, this webinar will provide an introduction to three electron microscopy techniques:
The Generation of X-rays and How They're Used for Elemental Analysis - Dr. Dan Haspel (University of Plymouth, U.K.)
Characterising engineering materials using electron backscatter diffraction (EBSD) - Dr. Vivian Tong (National Physical Laboratory, U.K.)
Focused Ion Beam: How It Complements Scanning Electron Microscopy - Dr. David Cox (University of Surrey, U.K.)
The event will be chaired by Dr. Helen Jones (National Physical Laboratory, U.K.).
This seminar will be held virtually - a link will be sent to registered attendees the day of the event and will also be available on the Eventbrite attendees page.
Please note - registration is currently not working for users of Microsoft Edge. Please use Chrome, Safari or Firefox. We apologise for any inconvenience caused.
To register, copy this link to your browser www.eventbrite.com/e/an-introduction-to-electron-microscopy-imaging-analysis-techniques-tickets-163531865211