An introduction to electron microscopy imaging analysis techniques
Scanning electron microscopes produce images by rastering a focused beam of electrons over the sample surface. These electrons interact with the atoms in the sample material, and the signal intensity of the emitted electrons at each point forms an image that contains topographic and microstructural information, with a resolution of a few nanometres. Additional emissions from the sample can be captured under specific imaging conditions, such as X-rays and diffraction patterns, to gain chemical and crystallographic information.
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