An Introduction to Electron Microscopy Imaging Analysis Techniques
The third in the series on advanced materials characterisation, this session will explore how X-rays, EBSD and ion beam techniques can be used to complement the images produced in the SEM.
The event, chaired by Dr Helen Jones of NPL, will feature three short presentations:
The Generation of X-rays and How They’re Used for Elemental Analysis, Dr. Dan Haspel, University of Plymouth
Characterising engineering materials using electron backscatter diffraction (EBSD), Dr.Vivian Tong, NPL
Focused Ion Beam: How It Complements Scanning Electron Microscopy, Dr. David Cox, University of Surrey