An Introduction to Electron Microscopy Imaging Analysis Techniques

The third in the series on advanced materials characterisation, this session will explore how X-rays, EBSD and ion beam techniques can be used to complement the images produced in the SEM. 

The event, chaired by Dr Helen Jones of NPL, will feature three short presentations:

• The Generation of X-rays and How They’re Used for Elemental Analysis, Dr. Dan Haspel, University of Plymouth

• Characterising engineering materials using electron backscatter diffraction (EBSD), Dr.Vivian Tong, NPL

• Focused Ion Beam: How It Complements Scanning Electron Microscopy, Dr. David Cox, University of Surrey

For more information visit the Southern Counties Materials, Minerals and Mining Society homepage or contact the organising team.