Novel 4D microscope developed
TESCAN has announced a new scanning transmission electron microscope (STEM) built from the ground up.
The microscope, named TESNOR, provides high resolution multimodal 2D and 3D characterisation at the nanoscale. It can help the analysis of: semiconductors; thin films for research and development; failure analysis of logic; memory; storage devices; and advanced packages.
It can also aid crystallographers by determining the crystallographic structure of small, sub-micron natural or synthetic particles that are too small to be characterized using micro-XRD techniques.
The novelty of TENSOR is its ease of use, with the Chief Product Officer Vratislav Koštál stating, ‘[TENSOR is] a more accessible TEM solution that is high-performing and productive for mainstream use’.
For more information visit: https://info.tescan.com/stem
